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IEC 60747-5-16 Ed. 1.0 en:2023

Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
standard by International Electrotechnical Commission, 03/01/2023

IEEE PC37.68

IEEE Draft Standard for Design, Test, and Application Requirements for Microprocessor-Based Controls of Distribution Pad-mount, Dry Vault, Wet Vault, and Polemount Switchgear Rated Above 1 kV and Up to and Including 38 kV
standard by IEEE,