METHOD FOR CHARACTERIZING THE ELECTROMIGRATION FAILURE TIME DISTRIBUTION OF INTERCONNECTS UNDER CONSTANT-CURRENT AND TEMPERATURE STRESS
standard by JEDEC Solid State Technology Association, 03/01/2006
JEDEC JEP179
DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION
standard by JEDEC Solid State Technology Association, 06/01/2006
JEDEC JESD282B.01
SILICON RECTIFIER DIODES
standard by JEDEC Solid State Technology Association, 11/01/2002
JEDEC JESD18-A
STANDARD FOR DESCRIPTION OF FAST CMOS TTL COMPATIBLE LOGIC
standard by JEDEC Solid State Technology Association, 01/01/1993
JEDEC JESD22-B113
BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 03/01/2006
JEDEC JESD247
Multi-wire Multi-level I/O Standard
standard by JEDEC Solid State Technology Association, 06/01/2016
JEDEC JESD203
STANDARD TEST LOADS FOR DUAL-SUPPLY LEVEL TRANSLATION DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2005
JEDEC JESD22-A120B
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 07/01/2014
JEDEC JESD223
Universal Flash Storage (UFS) Host Controller Interface
standard by JEDEC Solid State Technology Association, 08/01/2011
JEDEC JESD51-32
THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGES
standard by JEDEC Solid State Technology Association, 12/01/2010