HSUL_12 LPDDR2 I/O
standard by JEDEC Solid State Technology Association, 08/01/2009
JEDEC JESD 22-A121A (R2014)
MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
standard by JEDEC Solid State Technology Association, 07/01/2008
JEDEC JEP 148A
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008
JEDEC JEP134
GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998
JEDEC JEP106AM
STANDARD MANUFACTURER'S IDENTIFICATION CODE
standard by JEDEC Solid State Technology Association, 01/01/2014
JEDEC J-STD-609
MARKING AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES
standard by JEDEC Solid State Technology Association, 05/01/2007
JEDEC JESD 35-2
ADDENDUM No. 2 to JESD35 – TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 02/01/1996
JEDEC JEP 79
LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
standard by JEDEC Solid State Technology Association, 09/01/1969
JEDEC JESD218A
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 02/01/2011
JEDEC JEP 143B.01
SOLID STATE RELIABILITY ASSESSMENT QUALIFICATION METHODOLOGIES
standard by JEDEC Solid State Technology Association, 06/01/2008