LOW POWER DOUBLE DATA RATE 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 12/01/2010
JEDEC JESD22-A110E
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 07/01/2015
JEDEC JESD 12-4
ADDENDUM No. 4 to JESD12 – METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 04/01/1987
JEDEC JEP131A
PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
standard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JESD 84-C01
MULTIMEDIACARD (MMC) MECHANICAL STANDARD
standard by JEDEC Solid State Technology Association, 12/01/2007
JEDEC JESD252
SERIAL FLASH RESET SIGNALING PROTOCOL
standard by JEDEC Solid State Technology Association, 10/01/2018
JEDEC JESD 24-11 (R2002)
ADDENDUM No. 11 to JESD24 – POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 08/01/1996
JEDEC JESD46D
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERS
standard by JEDEC Solid State Technology Association,
JEDEC JEP151
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015
JEDEC JESD217
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
standard by JEDEC Solid State Technology Association, 09/01/2010