AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1966
JEDEC JEP115 (R1999)
POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD
standard by JEDEC Solid State Technology Association, 08/01/1989
JEDEC JEP137B
COMMON FLASH INTERFACE (CFI) IDENTIFICATION CODES
standard by JEDEC Solid State Technology Association, 05/01/2004
JEDEC JEB 15
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 11/01/1969
JEDEC JEP114.01
GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
standard by JEDEC Solid State Technology Association, 10/01/2007
JEDEC JEP001-1A
FOUNDRY PROCESS QUALIFICATION GUIDELINES – BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018
JEDEC JESD 78B
IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 12/01/2008
JEDEC JESD 22-A107B
SALT ATMOSPHERE
standard by JEDEC Solid State Technology Association, 01/01/2004
JEDEC EIA 397-1
ADDENDUM No. 1 TO EIA-397
Amendment by JEDEC Solid State Technology Association, 07/01/1980
JEDEC JESD 36
STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 06/01/1996